In-Situ Neutron Dosimetry for Single-Event Effect Accelerated Testing

Zhang, Lyn H., Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Edwards, R. H. and Allabush, C. (2009) In-Situ Neutron Dosimetry for Single-Event Effect Accelerated Testing. IEEE Transactions on Nuclear Science, 56 (4). pp. 2070-2076. ISSN 0018-9499

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Official URL: http://dx.doi.org/10.1109/TNS.2009.2013236

Abstract

We describe an in-situ fast neutron dosimetry system using silicon photodiodes, and discuss its application to accelerated testing for single-event effects (SEEs). Experimental data and theoretical analyses are presented and concept feasibility demonstrated.


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