Young, K.M., Cross, N., Smerdon, J.A., Dhanak, V.R., Sharma, H.R., Lograsso, T.A., Ross, A.R. and McGrath, R. (2011) XPS study of adsorption and desorption of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface. Philosophical Magazine, 91 (19-21). pp. 2889-2893. ISSN 14786435
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Official URL: http://dx.doi.org/10.1080/14786435.2010.536793
We have employed X-ray photoelectron spectroscopy to characterise the growth and thermal stability of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface. The growth can be characterised as Stranski-Krastanov, in agreement with previous STM studies. As a function of annealing temperature, the multilayer desorbs first and thereafter coverages of 1 ML and 0.5 ML are stable for significant temperature ranges.
|Uncontrolled Keywords (separate with ;):||bismuth; aluminium-palladium-manganese; X-ray photoelectron spectroscopy; scanning tunnelling microscopy; quasicrystal; surface; adsorption|
|Subjects:||Physical sciences > Physics|
|Schools:||Faculty of Science and Technology > School of Physical Sciences and Computing|
|Deposited By:||Carmit Erez|
|Deposited On:||10 May 2013 10:12|
|Last Modified:||17 May 2016 12:41|
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