Items where Author is "Bailey, P."

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Noakes, T.C.Q., Parle, J., Nugent, P., Sharma, H.R., Smerdon, Joe orcid iconORCID: 0000-0002-7387-8362, Bailey, P. and McGrath, R. (2014) Depth dependent order/disorder transitions in iron-rich thin films grown on i-Al–Pd–Mn studied by medium energy ion scattering. Surface Science, 620 . pp. 59-64. ISSN 00396028

Noakes, T.C.Q., Bailey, P., McConville, C.F., Draxler, M., Walker, M., Brown, M.G., Hentz, A., Woodruff, D.P., Lograsso, T.A. et al (2010) Two- and three-dimensional growth of Bi on i-Al-Pd-Mn studied using medium-energy ion scattering. Physical Review B - Condensed Matter and Materials Physics, 82 (19). pp. 1-9. ISSN 10980121

Noakes, T. C. Q., Bailey, P., McConville, C. F., Draxler, M., Walker, M., Brown, M. G., Hentz, A., Woodruff, D. P., Lograsso, T. A. et al (2010) Two-and three-dimensional growth of Bi on i-Al-Pd-Mn studied using medium-energy ion scattering. Physical Review B (PRB), 82 (19). p. 195418.

Smerdon, Joe orcid iconORCID: 0000-0002-7387-8362, Ledieu, J., McGrath, R., Noakes, T.C.Q., Bailey, P., Draxler, M., McConville, C.F., Lograsso, T.A. and Ross, A.R. (2006) Characterization of aperiodic and periodic thin Cu films formed on the five-fold surface of i- Al70 Pd21 Mn9 using medium-energy ion scattering spectroscopy. Physical Review B - Condensed Matter and Materials Physics, 74 (3). pp. 1-7. ISSN 10980121

Noakes, T.C.Q., Bailey, P., Draxler, M., McConville, C.F., Ross, A.R., Lograsso, T.A., Leung, L., Smerdon, Joe orcid iconORCID: 0000-0002-7387-8362 and McGrath, R. (2006) Film growth arising from the deposition of Au onto an i-Al-Pd-Mn quasicrystal: A medium energy ion scattering study. Journal of Physics Condensed Matter, 18 (22). pp. 5017-5027. ISSN 09538984

Noakes, T.C.Q., Bailey, P., McConville, C.F., Parkinson, C.R., Draxler, M., Smerdon, Joe orcid iconORCID: 0000-0002-7387-8362, Ledieu, J., McGrath, R., Ross, A.R. et al (2005) Compositional and structural changes in i-AlPdMn quasicrystals induced by sputtering and annealing: A medium energy ion scattering study. Surface Science, 583 (2-3). pp. 139-150. ISSN 00396028

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