Items where Author is "Platt, Simon Philip"

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Somov, A, Chew, Z, Ruan, T, Zhu, M and Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814 (2017) Ultra-low-power RADFET sensing circuit for wireless sensor networks powered by energy harvesting. In: 15th IEEE Sensors Conference, SENSORS 2016, 30 October - 2 November 2016, Orlando; United States.

Regnier, Stephane orcid iconORCID: 0000-0001-8954-4183, Alexander, Caroline, Walsh, Robert William orcid iconORCID: 0000-0002-1025-9863, Winebarger, A. R., Cirtain, J., Golub, L., Korreck, K. E., Mitchell, Nicholas Philip, Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814 et al (2014) Sparkling extreme-ultraviolet bright dots observed with Hi-C. The Astrophysical Journal, 784 (2). p. 134. ISSN 0004-637X

Kobayashi, Ken, Cirtain, Jonathan, Winebarger, Amy R, Korreck, Kelly, Golub, Leon, Walsh, Robert William orcid iconORCID: 0000-0002-1025-9863, De Pontieu, Bart, DeForest, Craig, Title, Alan et al (2014) The High-Resolution Coronal Imager (Hi-C). Solar Physics . ISSN 0038-0938

Alexander, Caroline, Walsh, Robert William orcid iconORCID: 0000-0002-1025-9863, Regnier, Stephane orcid iconORCID: 0000-0001-8954-4183, Cirtain, Jonathan, Winebarger, Amy R., Golub, Leon, Kobayashi, Ken, Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Mitchell, Nicholas Philip et al (2013) Anti-parallel EUV flows observed along active region filament threads with HI-C. The Astrophysical Journal, 775 (1). L32. ISSN 2041-8205

Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Prokofiev, Alexander V. and Cai, Xiaoxiao (2010) Fidelity of energy spectra at neutron facilities for single-event effects testing. In: Reliability Physics Symposium (IRPS), 2010 IEEE International. Institute of Electrical and Electronics Engineers (IEEE), Reston, VA, pp. 411-416. ISBN 978-1-4244-5430-3

Zhang, Lyn H., Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Edwards, R. H. and Allabush, C. (2009) In-Situ Neutron Dosimetry for Single-Event Effect Accelerated Testing. IEEE Transactions on Nuclear Science, 56 (4). pp. 2070-2076. ISSN 0018-9499

Cai, Xiao Xiao, Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814 and Chen, Wei (2009) Modelling Neutron Interactions in the Imaging SEE Monitor. IEEE Transactions on Nuclear Science, 56 (4). pp. 2035-2041. ISSN 0018-9499

Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Török, Zoltán, Frost, Chris D and Ansell, Stuart (2008) Charge-Collection and Single-Event Upset Measurements at the ISIS Neutron Source. IEEE Transactions on Nuclear Science, 55 (4). pp. 2126-2132. ISSN 0018-9499

Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814 and Török, Z. (2007) Analysis of SEE-Inducing Charge Generation in the Neutron Beam at The Svedberg Laboratory. IEEE Transactions on Nuclear Science, 54 (4). pp. 1163-1169. ISSN 0018-9499

Török, Z. and Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814 (2006) Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron Environments. IEEE Transactions on Nuclear Science, 53 (6). pp. 3718-3725. ISSN 0018-9499

Platt, Simon Philip orcid iconORCID: 0000-0003-4431-8814, Cassels, B and Török, Z (2005) Development and application of a neutron sensor for single event effects analysis. Journal of Physics: Conference Series, 15 . p. 172. ISSN 1742-6588

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