Zhang, Lyn H., Platt, Simon Philip ORCID: 0000-0003-4431-8814, Edwards, R. H. and Allabush, C.
(2009)
In-Situ Neutron Dosimetry for Single-Event Effect Accelerated Testing.
IEEE Transactions on Nuclear Science, 56
(4).
pp. 2070-2076.
ISSN 0018-9499
Full text not available from this repository.
Official URL: http://dx.doi.org/10.1109/TNS.2009.2013236
Abstract
We describe an in-situ fast neutron dosimetry system using silicon photodiodes, and discuss its application to accelerated testing for single-event effects (SEEs). Experimental data and theoretical analyses are presented and concept feasibility demonstrated.
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