Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate

Ledieu, J., Hoeft, J., Reid, D., Smerdon, Joe orcid iconORCID: 0000-0002-7387-8362, Diehl, R., Lograsso, T., Ross, A. and McGrath, R. (2004) Pseudomorphic Growth of a Single Element Quasiperiodic Ultrathin Film on a Quasicrystal Substrate. Physical Review Letters, 92 (13). ISSN 0031-9007

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Official URL: http://dx.doi.org/10.1103/PhysRevLett.92.135507

Abstract

An ultrathin film with a periodic interlayer spacing was grown by the deposition of Cu atoms on thefivefold surface of the icosahedral Al70 Pd21 Mn9 quasicrystal. For coverages from 5 to 25 monolayers, a distinctive quasiperiodic low-energy electron diffraction pattern is observed. Scanning tunneling microscopy images show that the in-plane structure comprises rows having separations of S = 4.5 �0.2 �A and L = 7.3 0.3 A, whose ratio equals � =1.618... within experimental error. The sequences of such row separations form segments of terms of the Fibonacci sequence, indicative of the formation of a pseudomorphic Cu film.


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