Somov, A, Chew, Z, Ruan, T, Zhu, M and Platt, Simon Philip ORCID: 0000-0003-4431-8814 (2017) Ultra-low-power RADFET sensing circuit for wireless sensor networks powered by energy harvesting. In: 15th IEEE Sensors Conference, SENSORS 2016, 30 October - 2 November 2016, Orlando; United States.
Hong, Q., Platt, S. P. ORCID: 0000-0003-4431-8814, Prokofiev, A. V. and Passoth, E. (2015) Detailed Geant4 simulations of the ANITA and ANITA-CUP neutron facilities. In: RADECS 2015, 14-18 September 2015, Moscow.
Regnier, Stephane ORCID: 0000-0001-8954-4183, Alexander, Caroline, Walsh, Robert William ORCID: 0000-0002-1025-9863, Winebarger, A. R., Cirtain, J., Golub, L., Korreck, K. E., Mitchell, Nicholas Philip, Platt, Simon Philip ORCID: 0000-0003-4431-8814 et al (2014) Sparkling extreme-ultraviolet bright dots observed with Hi-C. The Astrophysical Journal, 784 (2). p. 134. ISSN 0004-637X
Kobayashi, Ken, Cirtain, Jonathan, Winebarger, Amy R, Korreck, Kelly, Golub, Leon, Walsh, Robert William ORCID: 0000-0002-1025-9863, De Pontieu, Bart, DeForest, Craig, Title, Alan et al (2014) The High-Resolution Coronal Imager (Hi-C). Solar Physics . ISSN 0038-0938
Alexander, Caroline, Walsh, Robert William ORCID: 0000-0002-1025-9863, Regnier, Stephane ORCID: 0000-0001-8954-4183, Cirtain, Jonathan, Winebarger, Amy R., Golub, Leon, Kobayashi, Ken, Platt, Simon Philip ORCID: 0000-0003-4431-8814, Mitchell, Nicholas Philip et al (2013) Anti-parallel EUV flows observed along active region filament threads with HI-C. The Astrophysical Journal, 775 (1). L32. ISSN 2041-8205
Cai, Xiao Xiao, Platt, S. P. ORCID: 0000-0003-4431-8814 and Monk, S. D. (2011) Design of a Detector for Characterizing Neutron Fields for Single-Event Effects Testing. IEEE Transactions on Nuclear Science, 58 (3). 1123 -1128. ISSN 0018-9499
Cai, Xiao Xiao and Platt, S.P. ORCID: 0000-0003-4431-8814 (2011) Modeling Neutron Interactions and Charge Collection in the Imaging Single-Event Effects Monitor. IEEE Transactions on Nuclear Science, 58 (3). 910 -915. ISSN 0018-9499
Platt, Simon Philip ORCID: 0000-0003-4431-8814, Prokofiev, Alexander V. and Cai, Xiaoxiao (2010) Fidelity of energy spectra at neutron facilities for single-event effects testing. In: Reliability Physics Symposium (IRPS), 2010 IEEE International. Institute of Electrical and Electronics Engineers (IEEE), Reston, VA, pp. 411-416. ISBN 978-1-4244-5430-3
Zhang, Lyn H., Platt, Simon Philip ORCID: 0000-0003-4431-8814, Edwards, R. H. and Allabush, C. (2009) In-Situ Neutron Dosimetry for Single-Event Effect Accelerated Testing. IEEE Transactions on Nuclear Science, 56 (4). pp. 2070-2076. ISSN 0018-9499
Cai, Xiao Xiao, Platt, Simon Philip ORCID: 0000-0003-4431-8814 and Chen, Wei (2009) Modelling Neutron Interactions in the Imaging SEE Monitor. IEEE Transactions on Nuclear Science, 56 (4). pp. 2035-2041. ISSN 0018-9499
Platt, Simon Philip ORCID: 0000-0003-4431-8814, Török, Zoltán, Frost, Chris D and Ansell, Stuart (2008) Charge-Collection and Single-Event Upset Measurements at the ISIS Neutron Source. IEEE Transactions on Nuclear Science, 55 (4). pp. 2126-2132. ISSN 0018-9499
Andreani, C., Pietropaolo, A., Salsano, A., Gorini, G., Tardocchi, M., Paccagnella, A., Gerardin, S., Frost, C. D., Ansell, S. et al (2008) Facility for fast neutron irradiation tests of electronics at the ISIS spallation neutron source. Applied Physics Letters, 92 (11). pp. 114101-114104. ISSN 00036951
Platt, Simon Philip ORCID: 0000-0003-4431-8814 and Török, Z. (2007) Analysis of SEE-Inducing Charge Generation in the Neutron Beam at The Svedberg Laboratory. IEEE Transactions on Nuclear Science, 54 (4). pp. 1163-1169. ISSN 0018-9499
Török, Z. and Platt, Simon Philip ORCID: 0000-0003-4431-8814 (2006) Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron Environments. IEEE Transactions on Nuclear Science, 53 (6). pp. 3718-3725. ISSN 0018-9499
Platt, Simon Philip ORCID: 0000-0003-4431-8814, Cassels, B and Török, Z (2005) Development and application of a neutron sensor for single event effects analysis. Journal of Physics: Conference Series, 15 . p. 172. ISSN 1742-6588